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Auteur Ali Boultif |
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Titre : Approche de la forme des cristallites par la diffraction des rayons X Type de document : texte imprimé Auteurs : Hiba Mellakh, Auteur ; Ali Boultif, Directeur de thèse Editeur : constantine [Algérie] : Université Constantine 1 Année de publication : 2014 Importance : 64 f. Format : 30 cm. Note générale : 2 copies imprimées disponibles
Langues : Français (fre) Catégories : Français - Anglais
PhysiqueTags : Cristallographie Diffraction par poudres analyse microstructurale forme des cristallites taille des cristallites Méthode de Voigt RFI Déconvolution Dsize Powder diffraction microstructural analyse crystallite shape crystallite size Voigt
method انعرجاع الأشعة بواسطة المساحیق تحلیل البنیة على المستوى المجھري شكل البلورات حجم البلورات طریقة
Dsize – RFI – VoigIndex. décimale : 530 Physique Résumé : The work of this thesis concerns the determination of the morphology of the crystallites in a polycrystalline compound. Different shapes for the crystallites can be processed, it is the spherical shapes, cylindrical and parallelepiped. These morphologies were studied and translated as a program (DSIZE) by Langford.
The objective of this paper was to achieve the treatment of prismatic hexagonal base, because we felt that this morphology often appears in polycrystalline compounds which possess hexagonal symmetry.
Many questions are asked, then resolved during the work among which we mention the phase of the understanding and exploitation of various relationships used in this method of microstructural analysis. Thus, a lot of these relationships were demonstrated and several numeric values and curves related to these relationships were found, in order to go on knowledge devoid of any uncertainty.
The principle of determining the morphology of the crystallites is that of least squares.
After studying the method and the elements it uses, it was about building a hexagonal prism processing routine basis in accordance with the target set.
This treatment has been integrated in Langford program which we used as a working basis, so that different symmetries can be exploited by the user complementarity in a single unit.
The result of work has been verified by the realization of many theoretical and experimental cases tests and by the subsequent treatment of two morphologies, cylindrical and prismatic hexagonal base, whenever this was possible, allowing for comparisons and, therefore, confirm the results. Tests showed the proper functioning of the treatment used.
At the end of the work, the aspects related to the convergence of computing and also limiting the range of validity of the initial values corresponding to the shape parameters were considered: the convergence took place for each of the examples treated with the values far enough to the initial values.
Diplôme : Magistère En ligne : ../theses/physique/MEL6704.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=9919 Approche de la forme des cristallites par la diffraction des rayons X [texte imprimé] / Hiba Mellakh, Auteur ; Ali Boultif, Directeur de thèse . - constantine [Algérie] : Université Constantine 1, 2014 . - 64 f. ; 30 cm.
2 copies imprimées disponibles
Langues : Français (fre)
Catégories : Français - Anglais
PhysiqueTags : Cristallographie Diffraction par poudres analyse microstructurale forme des cristallites taille des cristallites Méthode de Voigt RFI Déconvolution Dsize Powder diffraction microstructural analyse crystallite shape crystallite size Voigt
method انعرجاع الأشعة بواسطة المساحیق تحلیل البنیة على المستوى المجھري شكل البلورات حجم البلورات طریقة
Dsize – RFI – VoigIndex. décimale : 530 Physique Résumé : The work of this thesis concerns the determination of the morphology of the crystallites in a polycrystalline compound. Different shapes for the crystallites can be processed, it is the spherical shapes, cylindrical and parallelepiped. These morphologies were studied and translated as a program (DSIZE) by Langford.
The objective of this paper was to achieve the treatment of prismatic hexagonal base, because we felt that this morphology often appears in polycrystalline compounds which possess hexagonal symmetry.
Many questions are asked, then resolved during the work among which we mention the phase of the understanding and exploitation of various relationships used in this method of microstructural analysis. Thus, a lot of these relationships were demonstrated and several numeric values and curves related to these relationships were found, in order to go on knowledge devoid of any uncertainty.
The principle of determining the morphology of the crystallites is that of least squares.
After studying the method and the elements it uses, it was about building a hexagonal prism processing routine basis in accordance with the target set.
This treatment has been integrated in Langford program which we used as a working basis, so that different symmetries can be exploited by the user complementarity in a single unit.
The result of work has been verified by the realization of many theoretical and experimental cases tests and by the subsequent treatment of two morphologies, cylindrical and prismatic hexagonal base, whenever this was possible, allowing for comparisons and, therefore, confirm the results. Tests showed the proper functioning of the treatment used.
At the end of the work, the aspects related to the convergence of computing and also limiting the range of validity of the initial values corresponding to the shape parameters were considered: the convergence took place for each of the examples treated with the values far enough to the initial values.
Diplôme : Magistère En ligne : ../theses/physique/MEL6704.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=9919 Exemplaires (1)
Code-barres Cote Support Localisation Section Disponibilité MEL/6704 MEL/6704 Thèse Bibliothèque principale Thèses Disponible
Titre : Elaboration et caractérisation par RX d’oxydes sous forme de couches minces Type de document : texte imprimé Auteurs : Amel Grine, Auteur ; Ali Boultif, Directeur de thèse Editeur : جامعة الإخوة منتوري قسنطينة Année de publication : 2015 Importance : 71 f. Format : 30 cm. Note générale : 2 copies imprimées disponibles
Langues : Français (fre) Catégories : Français - Anglais
PhysiqueTags : Diffraction par poudre microstructure couches minces méthodes de déconvolution RFI profil de raies Powder diffraction thin deconvolution methods line profile الانعراج على المسحوق البنية المجهرية السطوح الرقيقة الدالةRFI-deconvolution-profil Line Index. décimale : 530 Physique Résumé : The subject of this thesis deals with the development and characterization of thin films of iron oxide. The
objective is to optimize the parameters for development of thin films crystallized well.
The preparation of thin films studied was carried out by the sol-gel developed in the laboratory method.
Two kinds of aqueous solutions were used to make these thin layers. The first type of solution is formed of
a mixture of 1 ml of FeCl3 and 3 ml of HCl and the second type of solution consists of a mixture of 3 ml of
FeCl3 and 1 ml of HCl. Each of the two types is used to prepare several series of thin layers. Each set
corresponds to a given concentration of [Fe3+] and it consists of several thin films prepared at various
annealing temperatures.
The series from the first type of solution have not led to a diffraction. The thin films prepared from the
second type of solution have also, showed an insufficient crystallization except in the case of the series that
resulted from the concentration of 0.05 [Fe3+]. It is this series of layers that allowed, therefore, to continue
the work of memory analysis. Another series of layers obtained based on the concentration of 0.06 has
proved well crystallized.
Thin films of good crystallinity were subjected to X-ray analysis, SEM, in the IR and UV Visible.
The X-ray analysis was used to evaluate the average size of the crystallites constituting the layers. Thus,
the average sizes found for the crystallites grow with annealing temperature: the size from 20 nm to 130
nm. The microstrain serving on well-crystallized thin films were estimated by analyzing the diffraction
patterns. The values of deformations of lattice planes vary between 1/1000 and 7/1000.
The SEM images show that the morphology of the layers varies depending on the temperature. Average
morphology is first needles, low temperature and gets thick when the temperature increases, with a
curved shape of grains at 550 ° C.
The spectra obtained by UV spectroscopy show that the transmittance of the thin film of Fe2O3 increases
substantially as a function of the annealing temperature. There is a ""gap"" significantly larger between the
layer which have not undergone annealing and other layers obtained with annealing.
Furthermore, IR spectroscopy spectra show intense absorption peaks at wave numbers of around .2400
cm-1, 3350 cm-1 corresponding to the layer to 350 °C and around 2800 cm-1 and 3400 cm-1 for the layer
without annealing.
Diplôme : Magistère En ligne : ../theses/physique/GRI6950.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=10326 Elaboration et caractérisation par RX d’oxydes sous forme de couches minces [texte imprimé] / Amel Grine, Auteur ; Ali Boultif, Directeur de thèse . - جامعة الإخوة منتوري قسنطينة, 2015 . - 71 f. ; 30 cm.
2 copies imprimées disponibles
Langues : Français (fre)
Catégories : Français - Anglais
PhysiqueTags : Diffraction par poudre microstructure couches minces méthodes de déconvolution RFI profil de raies Powder diffraction thin deconvolution methods line profile الانعراج على المسحوق البنية المجهرية السطوح الرقيقة الدالةRFI-deconvolution-profil Line Index. décimale : 530 Physique Résumé : The subject of this thesis deals with the development and characterization of thin films of iron oxide. The
objective is to optimize the parameters for development of thin films crystallized well.
The preparation of thin films studied was carried out by the sol-gel developed in the laboratory method.
Two kinds of aqueous solutions were used to make these thin layers. The first type of solution is formed of
a mixture of 1 ml of FeCl3 and 3 ml of HCl and the second type of solution consists of a mixture of 3 ml of
FeCl3 and 1 ml of HCl. Each of the two types is used to prepare several series of thin layers. Each set
corresponds to a given concentration of [Fe3+] and it consists of several thin films prepared at various
annealing temperatures.
The series from the first type of solution have not led to a diffraction. The thin films prepared from the
second type of solution have also, showed an insufficient crystallization except in the case of the series that
resulted from the concentration of 0.05 [Fe3+]. It is this series of layers that allowed, therefore, to continue
the work of memory analysis. Another series of layers obtained based on the concentration of 0.06 has
proved well crystallized.
Thin films of good crystallinity were subjected to X-ray analysis, SEM, in the IR and UV Visible.
The X-ray analysis was used to evaluate the average size of the crystallites constituting the layers. Thus,
the average sizes found for the crystallites grow with annealing temperature: the size from 20 nm to 130
nm. The microstrain serving on well-crystallized thin films were estimated by analyzing the diffraction
patterns. The values of deformations of lattice planes vary between 1/1000 and 7/1000.
The SEM images show that the morphology of the layers varies depending on the temperature. Average
morphology is first needles, low temperature and gets thick when the temperature increases, with a
curved shape of grains at 550 ° C.
The spectra obtained by UV spectroscopy show that the transmittance of the thin film of Fe2O3 increases
substantially as a function of the annealing temperature. There is a ""gap"" significantly larger between the
layer which have not undergone annealing and other layers obtained with annealing.
Furthermore, IR spectroscopy spectra show intense absorption peaks at wave numbers of around .2400
cm-1, 3350 cm-1 corresponding to the layer to 350 °C and around 2800 cm-1 and 3400 cm-1 for the layer
without annealing.
Diplôme : Magistère En ligne : ../theses/physique/GRI6950.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=10326 Exemplaires (1)
Code-barres Cote Support Localisation Section Disponibilité GRI/6950 GRI/6950 Thèse Bibliothèque principale Thèses Disponible
