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Elaboration et caractérisation des couches minces du semiconducteur ZnO pures et dopées par le Cadmium / Badis Rahal
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Titre : Elaboration et caractérisation des couches minces du semiconducteur ZnO pures et dopées par le Cadmium Type de document : texte imprimé Auteurs : Badis Rahal, Auteur ; Boubekeur Boudine, Directeur de thèse Editeur : جامعة الإخوة منتوري قسنطينة Année de publication : 2017 Importance : 117 f. Format : 30 cm. Note générale : 2 copies imprimées disponibles
Langues : Français (fre) Catégories : Français - Anglais
PhysiqueTags : Zinc oxide Cadmium oxide Nanocomposite Thin films Dip-coating Colloidal Sol-Gel Oxyde de zinc Oxyde de cadmium Couches minces Dip-Coating Colloïdale Index. décimale : 530 Physique Résumé : The present work consists in the elaboration and characterization of the undoped and
cadmium-doped ZnO with different concentrations of cadmium (Cd) (1, 2, 5 and 10% in weight)
thin films in order to improve the structural and optical properties of ZnO. The samples were
prepared using two methods; Colloidal and Sol-Gel and deposited on glass and silicon substrates
by the Dip-coating technique.
The structural characterization showed the formation of ZnO with hexagonal structure
(wurtzite) with a preferential orientation according to plane (002) (sol-gel method). With the
exception of doping with 10% Cd (colloidal method), the formation of the ZnO/CdO
nanocomposite was assisted. SEM and AFM images revealed the nanometric character of our
films. The Raman diffusion confirmed the results of the DRX that is the formation of ZnO with
hexagonal structure (wurtzite).
The RBS spectroscopy has proved the existence, in our films, of the elements (zinc,
cadmium and oxygen) and gave us an idea on the thickness of the thin films. The measurement
of ellipsometry allowed us to evaluate the refractive index of our films and to estimate their
thickness. UV-visible spectroscopy has shown that our layers have a transparency, in the visible,
which varies between 70 and 90%. And that the gap decreases with the increase in doping. The
photoluminescence of the films showed ultraviolet (UV) and visible emissions related to defects.
Auger analysis on layers deposited on silicon substrates gave us an estimate of the thickness.Diplôme : Doctorat en sciences En ligne : ../theses/physique/RAH7052.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=10548 Elaboration et caractérisation des couches minces du semiconducteur ZnO pures et dopées par le Cadmium [texte imprimé] / Badis Rahal, Auteur ; Boubekeur Boudine, Directeur de thèse . - [S.l.] : جامعة الإخوة منتوري قسنطينة, 2017 . - 117 f. ; 30 cm.
2 copies imprimées disponibles
Langues : Français (fre)
Catégories : Français - Anglais
PhysiqueTags : Zinc oxide Cadmium oxide Nanocomposite Thin films Dip-coating Colloidal Sol-Gel Oxyde de zinc Oxyde de cadmium Couches minces Dip-Coating Colloïdale Index. décimale : 530 Physique Résumé : The present work consists in the elaboration and characterization of the undoped and
cadmium-doped ZnO with different concentrations of cadmium (Cd) (1, 2, 5 and 10% in weight)
thin films in order to improve the structural and optical properties of ZnO. The samples were
prepared using two methods; Colloidal and Sol-Gel and deposited on glass and silicon substrates
by the Dip-coating technique.
The structural characterization showed the formation of ZnO with hexagonal structure
(wurtzite) with a preferential orientation according to plane (002) (sol-gel method). With the
exception of doping with 10% Cd (colloidal method), the formation of the ZnO/CdO
nanocomposite was assisted. SEM and AFM images revealed the nanometric character of our
films. The Raman diffusion confirmed the results of the DRX that is the formation of ZnO with
hexagonal structure (wurtzite).
The RBS spectroscopy has proved the existence, in our films, of the elements (zinc,
cadmium and oxygen) and gave us an idea on the thickness of the thin films. The measurement
of ellipsometry allowed us to evaluate the refractive index of our films and to estimate their
thickness. UV-visible spectroscopy has shown that our layers have a transparency, in the visible,
which varies between 70 and 90%. And that the gap decreases with the increase in doping. The
photoluminescence of the films showed ultraviolet (UV) and visible emissions related to defects.
Auger analysis on layers deposited on silicon substrates gave us an estimate of the thickness.Diplôme : Doctorat en sciences En ligne : ../theses/physique/RAH7052.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=10548 Exemplaires (1)
Code-barres Cote Support Localisation Section Disponibilité RAH/7052 RAH/7052 Thèse Bibliothèque principale Thèses Disponible Elaboration des Couches minces du Semiconducteur ZnO dopées au Cobalt et étude de leurs propriétés structurales, optiques et électriques. / Ahmed Reda Khantoul
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Titre : Elaboration des Couches minces du Semiconducteur ZnO dopées au Cobalt et étude de leurs propriétés structurales, optiques et électriques. Type de document : texte imprimé Auteurs : Ahmed Reda Khantoul, Auteur ; Miloud Seffari, Directeur de thèse Editeur : جامعة الإخوة منتوري قسنطينة Année de publication : 2018 Importance : 108 f. Format : 30 cm. Note générale : 2 copies imprimées disponibles
Langues : Français (fre) Catégories : Français - Anglais
PhysiqueTags : Oxyde de zinc Cobalt Couches minces Dip-Coating Sol-Gel DRX MEB AFM Raman UV-Visible photoluminescence Zinc oxide cobalt thin films SEM ????? ????? ?????? ???? ???????? ???????-??????? ????? ???? ?????? ??????? ?????? ?????????? ?????? ???? ????? ?????? ?????? ????? ?????? ??????? ?????? ?????? ??? ?????????-??????? ????? ?????? ?????? Index. décimale : 530 Physique Résumé : The present work consists in the elaboration and characterization of the undoped and cobalt-doped ZnO with different concentrations of cobalt (Co) (0.5, 1, 5 and 10% in weight) thin films in order to improve the structural, morphological, optical and electrical properties of ZnO. The samples were prepared using the Sol-Gel method and deposited on glass substrates by the Dip-coating ""Dipping-Drawing"" technique. Structural haracterization showed the formation of ZnO of hexagonal structure (wurtzite) with a preferential orientation according to plane (002) and made it possible to determine the nanometric size of the crystallites. The SEM and AFM images revealed the nanometric character of our layers. Raman scattering confirmed the results of the XRD, namely the formation of ZnO with an hexagonal structure (wurtzite). UV-visible spectroscopy has shown that our layers have a transparency, in the visible, which varies between 80 and 98%. It has shown also that the gap decreases with the increase in doping. The hotoluminescence of the films showed ultraviolet (UV) and visible emissions related to defects. The codoping of aluminum to cobalt allowed us also to improve the structural and optical properties.
Diplôme : Doctorat en sciences En ligne : ../theses/physique/KHA7383.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=11033 Elaboration des Couches minces du Semiconducteur ZnO dopées au Cobalt et étude de leurs propriétés structurales, optiques et électriques. [texte imprimé] / Ahmed Reda Khantoul, Auteur ; Miloud Seffari, Directeur de thèse . - [S.l.] : جامعة الإخوة منتوري قسنطينة, 2018 . - 108 f. ; 30 cm.
2 copies imprimées disponibles
Langues : Français (fre)
Catégories : Français - Anglais
PhysiqueTags : Oxyde de zinc Cobalt Couches minces Dip-Coating Sol-Gel DRX MEB AFM Raman UV-Visible photoluminescence Zinc oxide cobalt thin films SEM ????? ????? ?????? ???? ???????? ???????-??????? ????? ???? ?????? ??????? ?????? ?????????? ?????? ???? ????? ?????? ?????? ????? ?????? ??????? ?????? ?????? ??? ?????????-??????? ????? ?????? ?????? Index. décimale : 530 Physique Résumé : The present work consists in the elaboration and characterization of the undoped and cobalt-doped ZnO with different concentrations of cobalt (Co) (0.5, 1, 5 and 10% in weight) thin films in order to improve the structural, morphological, optical and electrical properties of ZnO. The samples were prepared using the Sol-Gel method and deposited on glass substrates by the Dip-coating ""Dipping-Drawing"" technique. Structural haracterization showed the formation of ZnO of hexagonal structure (wurtzite) with a preferential orientation according to plane (002) and made it possible to determine the nanometric size of the crystallites. The SEM and AFM images revealed the nanometric character of our layers. Raman scattering confirmed the results of the XRD, namely the formation of ZnO with an hexagonal structure (wurtzite). UV-visible spectroscopy has shown that our layers have a transparency, in the visible, which varies between 80 and 98%. It has shown also that the gap decreases with the increase in doping. The hotoluminescence of the films showed ultraviolet (UV) and visible emissions related to defects. The codoping of aluminum to cobalt allowed us also to improve the structural and optical properties.
Diplôme : Doctorat en sciences En ligne : ../theses/physique/KHA7383.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=11033 Exemplaires (1)
Code-barres Cote Support Localisation Section Disponibilité KHA/7383 KHA/7383 Thèse Bibliothèque principale Thèses Disponible