Résultat de la recherche
4 résultat(s) recherche sur le tag 'Nanocomposite' 
Affiner la recherche Générer le flux rss de la recherche
Partager le résultat de cette recherche Interroger des sources externesSynthèse et caractérisation des nanocomposites polyéthèLne haute densité-Montmorillonite / Chérifa Boulechfar
Titre : Synthèse et caractérisation des nanocomposites polyéthèLne haute densité-Montmorillonite Type de document : texte imprimé Auteurs : Chérifa Boulechfar ; Université Mentouri, Editeur scientifique ; S. Bensaad, Directeur de thèse Année de publication : 2007 Importance : 112 f. Note générale : 01 Disponible à la salle de recherche 02 Disponibles au magazin de la B.U.C. 01 CD Langues : Français (fre) Tags : Nanocomposite Polyéthylène haute densité Melt intéraction Argile Montmorillonite Index. décimale : 540 Chimie et sciences connexes En ligne : ../theses/chimie/BOU5020.pdf Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=3763 Synthèse et caractérisation des nanocomposites polyéthèLne haute densité-Montmorillonite [texte imprimé] / Chérifa Boulechfar ; Université Mentouri, Editeur scientifique ; S. Bensaad, Directeur de thèse . - 2007 . - 112 f.
01 Disponible à la salle de recherche 02 Disponibles au magazin de la B.U.C. 01 CD
Langues : Français (fre)
Tags : Nanocomposite Polyéthylène haute densité Melt intéraction Argile Montmorillonite Index. décimale : 540 Chimie et sciences connexes En ligne : ../theses/chimie/BOU5020.pdf Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=3763 Exemplaires
Code-barres Cote Support Localisation Section Disponibilité aucun exemplaire
Titre : Caractérisations des réactions interfaciales dans les couches minces métalliques binaires et multiples Type de document : texte imprimé Auteurs : Farida Kezai (Née Medjani) ; Université Mentouri, Editeur scientifique ; Rachid Halimi, Directeur de thèse Année de publication : 2007 Importance : 89 f. Note générale : 01 Disponible à la salle de recherche 02 Disponibles au magazin de la B.U.C. 01 CD Langues : Français (fre) Tags : Pulvérisation Morphologie Multicouches TiN/AlN Nanocomposite Propriétés structurales Résistivité électrique Nanodureté Sputtering Multilayers TiN/AlN Zr-Si-N Structural proprieties Morphology Electrical resistivity Nanohardness Index. décimale : 530 Physique Résumé : DC reactive magnetron co-sputtering was used for the deposition of Zr-Si-N thin films and a multilayers TiN/AlN.
Si content (CSi) was varied by changing the power applied on the Si target, whereas that on Zr target was kept constant. Four series of samples have been deposited at various substrate temperatures: room temperature, 240 °C, 440 °C and 640 °C. The evolution of morphology,
crystalline structure, grain size and lattice constant has been investigated by X-ray diffraction analyses. Nanohardness, stress and resistivity measurements provide complementary information, which validate the proposed 3-step model for the film formation of the Zr-Si-N system deposited by reactive magnetron cosputtering. For low Si content the Si atoms substitute the Zr atoms in the ZrN lattice. Above the solubility limit, a nanocomposite film containing ZrN:Si nanocrystallites and amorphous SiNy is formed. Further increase of Si content results in a reduction of grain size (D), while the thickness of the SiNy layer at the crystallite surface remains constant. The increasing amount of the SiNy amorphous phase in the films is realized by increasing the surface to volume ratio of the crystallites. In this concentration range, the size of the crystallites in the Zr-Si-N films decreases according to the relationship CSi ~1/D. With
increasing the substrate temperature, the solubility limit of Si in ZrN decreases whereas the films’ global nitruration (CN /(CSi + CZr)) increases. The concentration dependence of the electrical resistivity is interpreted in terms of the variation of the SiNy layer thickness.
By controlling the thickness of individual layers (1-50 nm) and substrate bias (Vb = -25 V and V b = - 100V) two series of samples were prepared. The films were characterized using X-ray diffraction (DRX), cross-sectional electron microscopy (MET) and nanoindentation. The
measured hardness of multilayer films were found to be always higher than the rule of the mixture, but the magnitude of hardness enhancement was found to be dependent on the bilayer thickness and bias substrate. Decreasing progressively the layer thickness favors the alignment of
(0002) basal plan of w-AlN on (111) plane of TiN, and results in the development of strong (111) texture, prerequisite for stabilization of c-AlN and formation of epitaxial coherent structures.Diplôme : Doctorat En ligne : ../theses/physique/KEZ5008.pdf Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=3347 Caractérisations des réactions interfaciales dans les couches minces métalliques binaires et multiples [texte imprimé] / Farida Kezai (Née Medjani) ; Université Mentouri, Editeur scientifique ; Rachid Halimi, Directeur de thèse . - 2007 . - 89 f.
01 Disponible à la salle de recherche 02 Disponibles au magazin de la B.U.C. 01 CD
Langues : Français (fre)
Tags : Pulvérisation Morphologie Multicouches TiN/AlN Nanocomposite Propriétés structurales Résistivité électrique Nanodureté Sputtering Multilayers TiN/AlN Zr-Si-N Structural proprieties Morphology Electrical resistivity Nanohardness Index. décimale : 530 Physique Résumé : DC reactive magnetron co-sputtering was used for the deposition of Zr-Si-N thin films and a multilayers TiN/AlN.
Si content (CSi) was varied by changing the power applied on the Si target, whereas that on Zr target was kept constant. Four series of samples have been deposited at various substrate temperatures: room temperature, 240 °C, 440 °C and 640 °C. The evolution of morphology,
crystalline structure, grain size and lattice constant has been investigated by X-ray diffraction analyses. Nanohardness, stress and resistivity measurements provide complementary information, which validate the proposed 3-step model for the film formation of the Zr-Si-N system deposited by reactive magnetron cosputtering. For low Si content the Si atoms substitute the Zr atoms in the ZrN lattice. Above the solubility limit, a nanocomposite film containing ZrN:Si nanocrystallites and amorphous SiNy is formed. Further increase of Si content results in a reduction of grain size (D), while the thickness of the SiNy layer at the crystallite surface remains constant. The increasing amount of the SiNy amorphous phase in the films is realized by increasing the surface to volume ratio of the crystallites. In this concentration range, the size of the crystallites in the Zr-Si-N films decreases according to the relationship CSi ~1/D. With
increasing the substrate temperature, the solubility limit of Si in ZrN decreases whereas the films’ global nitruration (CN /(CSi + CZr)) increases. The concentration dependence of the electrical resistivity is interpreted in terms of the variation of the SiNy layer thickness.
By controlling the thickness of individual layers (1-50 nm) and substrate bias (Vb = -25 V and V b = - 100V) two series of samples were prepared. The films were characterized using X-ray diffraction (DRX), cross-sectional electron microscopy (MET) and nanoindentation. The
measured hardness of multilayer films were found to be always higher than the rule of the mixture, but the magnitude of hardness enhancement was found to be dependent on the bilayer thickness and bias substrate. Decreasing progressively the layer thickness favors the alignment of
(0002) basal plan of w-AlN on (111) plane of TiN, and results in the development of strong (111) texture, prerequisite for stabilization of c-AlN and formation of epitaxial coherent structures.Diplôme : Doctorat En ligne : ../theses/physique/KEZ5008.pdf Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=3347 Exemplaires
Code-barres Cote Support Localisation Section Disponibilité aucun exemplaire
Titre : Elaboration et caractérisation des couches minces du semiconducteur ZnO pures et dopées par le Cadmium Type de document : texte imprimé Auteurs : Badis Rahal, Auteur ; Boubekeur Boudine, Directeur de thèse Editeur : جامعة الإخوة منتوري قسنطينة Année de publication : 2017 Importance : 117 f. Format : 30 cm. Note générale : 2 copies imprimées disponibles
Langues : Français (fre) Tags : Zinc oxide Cadmium oxide Nanocomposite Thin films Dip-coating Colloidal Sol-Gel Oxyde de zinc Oxyde de cadmium Couches minces Dip-Coating Colloïdale Index. décimale : 530 Physique Résumé : The present work consists in the elaboration and characterization of the undoped and
cadmium-doped ZnO with different concentrations of cadmium (Cd) (1, 2, 5 and 10% in weight)
thin films in order to improve the structural and optical properties of ZnO. The samples were
prepared using two methods; Colloidal and Sol-Gel and deposited on glass and silicon substrates
by the Dip-coating technique.
The structural characterization showed the formation of ZnO with hexagonal structure
(wurtzite) with a preferential orientation according to plane (002) (sol-gel method). With the
exception of doping with 10% Cd (colloidal method), the formation of the ZnO/CdO
nanocomposite was assisted. SEM and AFM images revealed the nanometric character of our
films. The Raman diffusion confirmed the results of the DRX that is the formation of ZnO with
hexagonal structure (wurtzite).
The RBS spectroscopy has proved the existence, in our films, of the elements (zinc,
cadmium and oxygen) and gave us an idea on the thickness of the thin films. The measurement
of ellipsometry allowed us to evaluate the refractive index of our films and to estimate their
thickness. UV-visible spectroscopy has shown that our layers have a transparency, in the visible,
which varies between 70 and 90%. And that the gap decreases with the increase in doping. The
photoluminescence of the films showed ultraviolet (UV) and visible emissions related to defects.
Auger analysis on layers deposited on silicon substrates gave us an estimate of the thickness.Diplôme : Doctorat en sciences En ligne : ../theses/physique/RAH7052.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=10548 Elaboration et caractérisation des couches minces du semiconducteur ZnO pures et dopées par le Cadmium [texte imprimé] / Badis Rahal, Auteur ; Boubekeur Boudine, Directeur de thèse . - [S.l.] : جامعة الإخوة منتوري قسنطينة, 2017 . - 117 f. ; 30 cm.
2 copies imprimées disponibles
Langues : Français (fre)
Tags : Zinc oxide Cadmium oxide Nanocomposite Thin films Dip-coating Colloidal Sol-Gel Oxyde de zinc Oxyde de cadmium Couches minces Dip-Coating Colloïdale Index. décimale : 530 Physique Résumé : The present work consists in the elaboration and characterization of the undoped and
cadmium-doped ZnO with different concentrations of cadmium (Cd) (1, 2, 5 and 10% in weight)
thin films in order to improve the structural and optical properties of ZnO. The samples were
prepared using two methods; Colloidal and Sol-Gel and deposited on glass and silicon substrates
by the Dip-coating technique.
The structural characterization showed the formation of ZnO with hexagonal structure
(wurtzite) with a preferential orientation according to plane (002) (sol-gel method). With the
exception of doping with 10% Cd (colloidal method), the formation of the ZnO/CdO
nanocomposite was assisted. SEM and AFM images revealed the nanometric character of our
films. The Raman diffusion confirmed the results of the DRX that is the formation of ZnO with
hexagonal structure (wurtzite).
The RBS spectroscopy has proved the existence, in our films, of the elements (zinc,
cadmium and oxygen) and gave us an idea on the thickness of the thin films. The measurement
of ellipsometry allowed us to evaluate the refractive index of our films and to estimate their
thickness. UV-visible spectroscopy has shown that our layers have a transparency, in the visible,
which varies between 70 and 90%. And that the gap decreases with the increase in doping. The
photoluminescence of the films showed ultraviolet (UV) and visible emissions related to defects.
Auger analysis on layers deposited on silicon substrates gave us an estimate of the thickness.Diplôme : Doctorat en sciences En ligne : ../theses/physique/RAH7052.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=10548 Exemplaires
Code-barres Cote Support Localisation Section Disponibilité aucun exemplaire
Titre : La synthèse des nano particules de CuO avec la méthode de précipitation sol_ gel : en utilisant le précurseur CuCl2 et l'étude de leurs propriétés structurales et optiques Type de document : texte imprimé Auteurs : Rabie Bacha, Auteur ; Abderrahmane Chaieb, Directeur de thèse Editeur : constantine [Algérie] : Université Constantine 1 Année de publication : 2015 Importance : 91 f. Format : 30 cm. Note générale : 2 copies imprimées disponibles
Langues : Français (fre) Tags : Semi-conducteurs CuO composite nanocomposite matrice polymère procédé sol-gel masse effective « spin –coating » gap optique CuO/PMMA thin film powders (sol-gel) process optical properties structural analysis ???????? ??????? ??????? ???-??? ????? ?????? Index. décimale : 530 Physique Résumé : The object of this thesis is the synthesis and characterization of the copper oxide powders “CuO” and its composite thin film of (CuO/PMMA), by (sol-gel) process (wet-chemistry route), also the comparison between two methods of preparation using two different precursors.
The Work was divided into two parts:
The first part allowed to the preparation of the “CuO” powder, and its composite thin film of (CuO/PMMA), by the precursor (CuCl2, 2H2O), and the study of its structural, morphological, and optical properties, we also study in this part the annealing temperature effect on the size of CuO crystallites.
The second part was dedicated to prepare the CuO powder, and its composite thin film (CuO/PMMA), by precursor (Cu (CH3COO) 2, H2O), and DMF (CH3) 2 NC (OH), as solvent, and also the study of the structural, and optical properties.
Various analysis techniques have been used to characterize the CuO powders and its composite (CuO/PMMA) thin films, they are divided into two category:
- The structural analysis including the x-rays diffraction (XRD), the infrared spectroscopy (IR) and the electron scanning microscopy.
- Optical properties and band gap of CuO were studied by UV-Vis spectroscopy.
For the CuO powders prepared by the first precursor (CuCl2, 2H2O), and with different annealing temperatures, the study by x-rays diffraction (XRD) reveals single phase monoclinic structure of CuO, the average crystallite size increased with increasing of annealing temperature.
For the powder CuO to prepare with the second precursor (Cu (CH3COO) 2, H2O) the study by the x-rays diffraction(XRD) , reveals single phase monoclinic structure of CuO, the average crystallite size of the powder annealed to 450 C° is 16,76nm.
The study of the optical properties of the CuO/PMMA composite thin films by the two methods has shown a band gap is estimated to be 3, 90 eV.
Diplôme : Magistère En ligne : ../theses/physique/BAC6717.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=9906 La synthèse des nano particules de CuO avec la méthode de précipitation sol_ gel : en utilisant le précurseur CuCl2 et l'étude de leurs propriétés structurales et optiques [texte imprimé] / Rabie Bacha, Auteur ; Abderrahmane Chaieb, Directeur de thèse . - constantine (Route ain el bey, Algérie) : Université Constantine 1, 2015 . - 91 f. ; 30 cm.
2 copies imprimées disponibles
Langues : Français (fre)
Tags : Semi-conducteurs CuO composite nanocomposite matrice polymère procédé sol-gel masse effective « spin –coating » gap optique CuO/PMMA thin film powders (sol-gel) process optical properties structural analysis ???????? ??????? ??????? ???-??? ????? ?????? Index. décimale : 530 Physique Résumé : The object of this thesis is the synthesis and characterization of the copper oxide powders “CuO” and its composite thin film of (CuO/PMMA), by (sol-gel) process (wet-chemistry route), also the comparison between two methods of preparation using two different precursors.
The Work was divided into two parts:
The first part allowed to the preparation of the “CuO” powder, and its composite thin film of (CuO/PMMA), by the precursor (CuCl2, 2H2O), and the study of its structural, morphological, and optical properties, we also study in this part the annealing temperature effect on the size of CuO crystallites.
The second part was dedicated to prepare the CuO powder, and its composite thin film (CuO/PMMA), by precursor (Cu (CH3COO) 2, H2O), and DMF (CH3) 2 NC (OH), as solvent, and also the study of the structural, and optical properties.
Various analysis techniques have been used to characterize the CuO powders and its composite (CuO/PMMA) thin films, they are divided into two category:
- The structural analysis including the x-rays diffraction (XRD), the infrared spectroscopy (IR) and the electron scanning microscopy.
- Optical properties and band gap of CuO were studied by UV-Vis spectroscopy.
For the CuO powders prepared by the first precursor (CuCl2, 2H2O), and with different annealing temperatures, the study by x-rays diffraction (XRD) reveals single phase monoclinic structure of CuO, the average crystallite size increased with increasing of annealing temperature.
For the powder CuO to prepare with the second precursor (Cu (CH3COO) 2, H2O) the study by the x-rays diffraction(XRD) , reveals single phase monoclinic structure of CuO, the average crystallite size of the powder annealed to 450 C° is 16,76nm.
The study of the optical properties of the CuO/PMMA composite thin films by the two methods has shown a band gap is estimated to be 3, 90 eV.
Diplôme : Magistère En ligne : ../theses/physique/BAC6717.pdf Format de la ressource électronique : Permalink : https://bu.umc.edu.dz/md/index.php?lvl=notice_display&id=9906 Exemplaires
Code-barres Cote Support Localisation Section Disponibilité aucun exemplaire
